Texas Instruments DRV8106S-Q1EVM Gate Driver Evaluation Module
Texas Instruments DRV8106S-Q1EVM Gate Driver Evaluation Module (EVM) is designed to evaluate the DRV8106S-Q1, an integrated, automotive-qualified brushed DC motor driver. The DRV8106S-Q1 is a highly integrated half-bridge gate driver capable of driving high-side and low-side N-channel power MOSFETs. It generates the proper gate drive voltages using an integrated doubler charge pump for the high-side and a linear regulator for the low-side. The Texas Instruments DRV8106S-Q1EVM has a half-bridge consisting of two N-channel MOSFETs that drive motors bi-directionally up to 15A RMS, 20A peak current. The evaluation module operates from a single power supply for the analog power and from the USB line for the digital power, which can be customized to be externally supplied. A negative 18V reverse battery protection circuit with a 20A RMS rated PI filter is provided to clean up the power supply input and protect against incorrect battery connections.
Features
- Half-bridge smart gate driver evaluation module for automotive applications
- –40°C to +125°C, TA temperature grade 1
- 4.9V to 37V operating range
- Doubler charge pump for 100% PWM
- Half-bridge control mode
- SPI interface for detailed configuration and diagnostics
- Smart gate drive architecture
- Adjustable slew rate control
- 0.5mA to 62mA peak source current output
- 0.5mA to 62mA peak sink current output
- Integrated dead-time handshaking
- MOSFET drain to source and gate monitors
- Wide common-mode current shunt amplifier
- Inline sensing
- Adjustable gain settings (10V/V, 20V/V, 40V/V, 80V/V)
- Integrated feedback resistors
- Adjustable PWM blanking scheme
- Integrated protection features
- Dedicated driver disable pin (drvoff)
- Supply and regulator voltage monitors
- MOSFET VDS overcurrent monitors
- MOSFET VGS gate fault monitors
- Charge pump for reverse polarity MOSFET
- Offline open load and short circuit diagnostics
- Device thermal warning and shutdown
- Fault condition interrupt pin (nFAULT)
Related Product
Texas Instruments DRV8106-Q1 Automotive Smart Gate Drivers
Capable of driving high-side and low-side N-channel power MOSFETs.
Paskelbta: 2021-02-15
| Atnaujinta: 2024-10-29